Journal Publications

Send a mail to kaplan@technion.ac.il and I’ll be happy to send you a PDF of any of the papers below:

 

Refereed Papers in Professional Journals:

 

147    P. Ghosh, R. Marder, A. Berner and W. D. Kaplan, The Influence of Temperature on the Solubility Limit of Ca in Alumina, Journal of the European Ceramic Society, 40: 5767-5772, 2020. https://doi.org/10.1016/j.jeurceramsoc.2020.07.057

146    H. Sternlicht, W. Rheinheimer, A. Mehlmann, A. Rothschild, M. J. Hoffmann and W. D. Kaplan, The Mechanism of Grain Growth at General Grain Boundaries in SrTiO3, Scripta Materialia, 188: 206-211, 2020.

145    R. Moshe and W.D. Kaplan, The Combined Influence of Mg and Ca on Microstructural Evolution of Alumina, Journal of the American Ceramic Society, 102[8]: 4882-4887, 2019.

144    Ting Mao, Hadar Nahor, and Wayne D. Kaplan, Ca Segregation at Au-YSZ Interfaces, Journal of Materials Science, 54[10]: 7719–7727, 2019.

143    H. Nahor and W D. Kaplan, Ni-YSZ(001) solid-solid interfacial energy and orientation relationships, Journal of the American Ceramic Society, 102 [5]: 2987-2998, 2019.

142    R. Moshe, W.D. Kaplan, The influence of CaO on alumina grain boundary mobility, Journal of the European Ceramic Society, 39[4]:1324-1328, 2019.  doi.org/10.1016/j.jeurceramsoc.2018.10.014

141    H. Nahor, Y. Kauffmann and W. D. Kaplan, The Cr-Doped Ni-YSZ(111) Interface: Segregation, Oxidation and the Ni Equilibrium Crystal Shape, Acta Materialia, 166: 28-36, 2019.

140    H. Sternlicht, W. Rheinheimer, J. Kim, E. Liberti, A. I. Kirkland, M. J. Hoffmann and W. D. Kaplan, Characterization of grain boundary disconnections in SrTiO3 Part II: the influence of superimposed disconnections on image analysis, Journal of Materials Science, 54 [5]: 3710-3725, 2019.

139    H. Sternlicht, W. Rheinheimer, R. E. Dunin-Borkowski, M. J. Hoffmann and W. D. Kaplan, Characterization of grain boundary disconnections in SrTiO3 part I: the dislocation component of grain boundary disconnections, Journal of Materials Science, 54 [5]: 3694-3709, 2019.

138    H. Nahor, Y. Kauffmann, S. Lazar, D. Shilo and W. D. Kaplan, Discerning Interface Atomistic Structure by Phase Contrast in STEM: The Equilibrated Ni-YSZ Interface, Acta Materialia, 154: 71-78, 2018.

137    H. Sternlicht, S.A. Bojarski, G.S. Rohrer and W.D. Kaplan, Quantitative Differences in the Y Grain Boundary Excess at Boundaries Delimiting Large and Small Grains in Y Doped Al2O3, Journal of the European Ceramic Society, 38[4]: 1829-1835, 2018.

136    V. Mikhelashvili, G. Ankonina, Y. Kauffmann, G. Atiya, W. D. Kaplan, R. Padmanabhan and G. Eisenstein, Optical control of capacitance in a metal-insulator-semiconductor diode with embedded metal nanoparticles, J. Applied Physics, 121 [21]: 214504, 2017.

135    K.S. Virdi, Y. Kauffmann, C. Ziegler, P. Ganter, P. Blaha, B.V. Lotsch, W.D. Kaplan, C. Scheu, Band Gap Extraction from Individual Two-Dimensional Perovskite Nanosheets Using Valence Electron Energy Loss Spectroscopy, Journal of Physical Chemistry C, 120[20]:11170-11179, 2016.

134    H. Choi, W.D. Kaplan, H. Choe, Effect of Yttrium on the Fracture Strength of the Sn-1.0Ag-0.5Cu Solder Joints, Journal of Electronic Materials, 45[7]:3259-3262, 2016.

133    R. Padmanabhan, O. Eyal, B. Meyler, S. Yofis, G. Atiya, W.D. Kaplan, V. Mikhelashvili, G. Eisenstein, Dynamical Properties of Optically Sensitive Metal-Insulator-Semiconductor Nonvolatile Memories Based on Pt Nanoparticles, IEEE Transactions on Nanotechnology, 15[3]:492-498, 2016.

132    Hadar Nahor, Wayne D. Kaplan, Structure of the Equilibrated Ni(111)-YSZ(111) Solid-Solid Interface, Journal of the American Ceramic Society, 99[3]:1064-1070, 2016.

131    Hadas Sternlicht, Wolfgang Rheinheimer, Michael Hoffmann, Wayne D. Kaplan, The mechanism of grain boundary motion in SrTiO3, Journal of Materials Science, 51[1]:467-475, 2016.  DOI: 10.1007/s10853-015-9058-1

130    V. Mikhelashvili, R. Padmanabhan, B. Meyler, S. Yofis, G. Atiya, Z. Cohen-Hyams, S. Weindling, G. Ankonina, J. Salzman, W.D. Kaplan, G. Eisenstein, Optically sensitive devices based on Pt nano particles fabricated by atomic layer deposition and embedded in a dielectric stack, Journal of Applied Physics, 118[13]:134504, 2015.

129    Wayne D. Kaplan, The mechanism of crystal deformation, Science, 349[6252]:1059-1060, 2015.

128    Dominique Chatain, Stefano Curiotto, Paul Wynblatt, Hila Meltzman, Wayne D. Kaplan, Gregory S. Rohrer, Orientation Relationships of Copper Crystals on Sapphire  (10-10) m-Plane and (10-12) r-Plane Substrates, Journal of Crystal Growth, 418:57-63, 2015.

127    Vissarion Mikhelashvili, David Crestea, Boris Meyler, Svetlana Yofis, Yakov Shneider, Galit Atiya, Tzipi Cohen-Hyams, Yaron Kauffmann, Wayne D. Kaplan, and Gadi Eisenstein, Highly Sensitive Optically Controlled Tunable Capacitor and Photodetector Based on a Metal-Insulator-Semiconductor on Silicon-on-Insulator Substrates, Journal of Applied Physics, 117[4]:44503-1-8, 2015.

126    Eran Gross, Dana Benes Dahan, and Wayne D. Kaplan, The Role of Carbon and SiO2 in Solid-State Sintering of SiC, Journal of the European Ceramic Society, 35[7]:2001-2005, 2015.

125    M. Gandman, Y. Kauffmann, W.D. Kaplan, Quantification of ordering at a solid-liquid interface using plasmon electron energy loss spectroscopy, Applied Physics Letters, 106[5]:051603, 2015.

124    T. Dennenwaldt, M. Lübbe, M. Winklhofer, A. Müller, M. Döblinger, H.S. Nabi, M. Gandman, T. Cohen-Hyams, W.D. Kaplan, W. Moritz, R. Pentcheva and C. Scheu, Insights into the Structural, Electronic and Magnetic Properties of Fe2-xTixO3/Fe2O3 thin films with x = 0.44 grown on Al2O3 (0001), Journal of Materials Science, 50[1]:122-137, 2015.

123    G. Atiya, D. Chatain, V. Mikhelashvili, G. Eisenstein, W.D. Kaplan, The role of abnormal grain growth on solid-state dewetting kinetics, Acta Materialia, 81:304-314, 2014.

122    V. Mikhelashvili, D. Cristea, B. Meyler, S. Yofis, Y. Shneider, G. Atiya, T. Cohen-Hyams, Y. Kauffmann, W.D. Kaplan, G. Eisenstein, A highly sensitive broadband planar metal-oxide-semiconductor photo detector fabricated on a silicon-on-insulator substrate, Journal of Applied Physics, 116[7]:074513-7, 2014.

121    R. Moshe, A. Berner, W.D. Kaplan, The solubility limit of SiO2 in α-alumina at 1600°C, Scripta Materialia, 86:40-43, 2014.

120    N. L. Barham, W. D. Kaplan, D. Rittel, Static and Dynamic Mechanical Properties of Alumina Reinforced with Sub-Micron Ni Particles, Materials Science & Engineering A, 597:1-9, 2014.

119    R. Akiva, A. Katsman, and W.D. Kaplan, Anisotropic Grain Boundary Mobility in Undoped and Doped Alumina, Journal of the American Ceramic Society, 97[5]:1610-1618, 2014.

118    H. Nahor, H. Meltzman, W.D. Kaplan, Ni–YSZ(111) solid–solid interfacial energy, Journal of Materials Science, 49[11]:3943-3950, 2014.

117    A. Altberg, G. Atiya, V. Mikhelashvili, G. Eisenstein, W.D. Kaplan, The equilibrium orientation relationship between Pt and SrTiO3 and its implication on Pt films deposited by physical vapor phase deposition, Journal of Materials Science, 49[11]:3917-3927, 2014.

116    G. Atiya, V. Mikhelashvili, G. Eisenstein, W. Kaplan, Solid-state dewetting of Pt on (100) SrTiO3, Journal of Materials Science, 49[11]:3863-3874, 2014.

115    N. Ni, Y. Kaufmann, W.D. Kaplan, E. Saiz, Interfacial Energies and Mass Transport in the Ni(Al)/Al2O3 System: The Implication of Very Low Oxygen Activities, Acta Materialia, 64:282-296, 2014.

114    R. Akiva, A. Berner, W. D. Kaplan, The Solubility Limit of CaO in α-Alumina at 1600°C, Journal of the American Ceramic Society, 96[10]:3258-3264, 2013.

113    A. Marynski, G. Sek, A. Musial, J. Andrzejewski, J. Misiewicz, C. Gilfert, J.P. Reithmaier, A. Capua, O. Karni, D. Gready, G. Eisenstein, G. Atiya, W.D. Kaplan, S. Kolling, Electronic Structure, Morphology and Emission Polarization of Enhanced Symmetry InAs Quantum-Dot-Like Structures Grown on InP Substrates by Molecular Beam Epitaxy, Journal of Applied Physics, 114[9]:094306-7, 2013.

112    G. Gluzer, W.D. Kaplan, Particle Occlusion and Mechanical Properties of Ni–Al2O3 Nanocomposites, Journal of the European Ceramic Society, 33[15–16]:3101-3113, 2013.

111    W.D. Kaplan, D. Chatain, P. Wynblatt, W.C. Carter, A Review of Wetting Versus Adsorption, Complexions, and Related Phenomena: The Rosetta Stone of Wetting, Journal of Materials Science, 48[17]:5681-5717, 2013.   (Review)

110    E. J. McDermott, E. Wirnhier, W. Schnick, K. S. Virdi, C. Scheu, Y. Kauffmann, W. D. Kaplan, E. Z. Kurmaev, A. Moewes, Band Gap Tuning in Poly(triazine imide), a Nonmetallic Photocatalyst, The Journal of Physical Chemistry C, 117:8806-8812, 2013.

109    Kulpreet S. Virdi, Yaron Kauffmann, Christian Ziegler, Pirmin Ganter, Bettina V. Lotsch, Wayne D. Kaplan, Peter Blaha, Christina Scheu, Electronic Structure of KCa2Nb3O10 as Envisaged by Density Functional Theory and Valence Electron Energy Loss Spectroscopy, Physical Review B, 87[11]:115108, 2013.

108    Maria Gandman, Yaron Kauffmann, Christoph T. Koch, and Wayne D. Kaplan, Direct Quantification of Ordering at a Solid-Liquid Interface Using Aberration Corrected Transmission Electron Microscopy, Physical Review Letters, 110[8]:086106, 2013.

107    V. Mikhelashvili, B. Meyler, Y. Shneider, S.Yofis, J. Salzman, G. Atiya, T. Cohen-Hyams, G. Ankonina, W.D. Kaplan, M. Lisiansky, Y. Roizin, G. Eisenstein, Ultraviolet to Near Infrared Response of Optically Sensitive Nonvolatile Memories Based on Platinum Nano-Particles and High-k Dielectrics on a SOI Substrate, Journal of Applied Physics, 113[7]:074503-6, 2013.

106    S. Curiotto, H. Chien, H. Meltzman, S. Labat, P. Wynblatt, G. Rohrer, W. Kaplan, D. Chatain, Copper crystals on the (11-20) sapphire plane: orientation relationships, triple line ridges and interface shape equilibrium, Journal of Materials Science, 48[7]:3013-3026, 2013.

105    B. Nijikovsky, J. Richardson, M. Garbrecht, S. DenBaars, W.D. Kaplan, Microstructure of ZnO films synthesized on MgAl2O4 from low-temperature aqueous solution: growth and post-annealing, Journal of Materials Science, 48[4]:1614-1622, 2013.

104    H. Meltzman, T. M. Besmann, W. D. Kaplan, Hf-Doped Ni–Al2O3 Interfaces at Equilibrium, Journal of the American Ceramic Society, 95[12]:3997-4003, 2012.

103    J. K. Tripathi, M. Garbrecht, W. D. Kaplan, G. Markovich, I. Goldfarb, The Effect of Fe-Coverage on the Structure, Morphology and Magnetic Properties of α-FeSi2 Nanoislands, Nanotechnology, 23[49]:495603, 2012.

102    Tamar Kadosh, Yachin Cohen, Yeshayahu Talmon, and Wayne D. Kaplan, In-Situ Characterization of Spinel Nanoceramic Suspensions, Journal of the American Ceramic Society, 95[10]: 3103-3108, 2012.

101    V. Mikhelashvili, Y. Shneider, B. Meyler, G. Atiya, S. Yofis, T. Cohen-Hyams, W. D. Kaplan, M. Lisiansky, Y. Roizin, J. Salzman, G. Eisenstein, Non-Volatile Memory Transistor Based on Pt Nanocrystals with Negative Differencial Resistance, Journal of Applied Physics, 112[2]:024319-5, 2012.

100    Hila Meltzman, Dan Mordehai and Wayne D. Kaplan, Solid-Solid Interface Reconstruction at Equilibrated Ni-Al2O3 Interfaces, Acta Materialia, 60: 4359-4369, 2012.

99      Elad Nussbaum, Hila Meltzman, and Wayne D. Kaplan, Equilibrium Segregation of Ti to Au-Sapphire Interfaces, Journal of Materials Science, 47[4]: 1647-1654, 2012.

98      Raul Pina-Zapardiel, Isabel Montero, Antonio Esteban-Cubillo, Jose S. Moya, Wayne D. Kaplan, Thangadurai Paramasivam, Carlos Pecharroman, Palladium Nanoparticles on Silica-Rich Substrates by Spontaneous Reduction at Room Temperature, Journal of Nanoparticle Research, 13[10]:5239-5249, 2011.

97      M. Baram, S. H. Garofalini and W. D. Kaplan, Order in Nanometer Thick Intergranular Films at Au-Sapphire Interfaces, Acta Materialia, 59[14]:5710-5715, 2011.

96      S. Curiotto, H. Chien, H. Meltzman, P. Wynblatt, G.S. Rohrer, W.D. Kaplan, D. Chatain, Orientation Relationships of Copper Crystals on C-Plane Sapphire, Acta Materialia, 59[13]: 5320–5331 ,2011.

95      V. Mikhelashvili, B. Meyler, S. Yofis, Y. Shneider, A. Zeidler, M. Garbrecht, T. Cohen-Hyams, W. D. Kaplan, M. Lisiansky, Y. Roizin, J. Salzman, G. Eisenstein, Non-Volatile Low-Voltage Memory Transistors Based on SiO2 Tunneling and HfO2 Blocking Layers with Charge Storage in Au Nanocrystals, Applied Physics Letters, 98:212902-3, 2011.

94      Y. Kauffmann, S.H. Oh, C.T. Koch, A. Hashibon, C. Scheu, M. Rühle, and W.D. Kaplan, Quantitative Analysis of Layering and In-Plane Structural Ordering at an Alumina-Aluminum Solid-Liquid Interface, Acta Materialia, 59[11]: 4378-4386, 2011.

93      J. K. Tripathi, M. Garbrecht, C. G. Sztrum-Vartash, E. Rabani, W. D. Kaplan and I. Goldfarb, Coverage-dependent self-organized ordering of Co- and Ti-silicide nanoislands along step-bunch edges of vicinal Si(111), Physical Review B, 83[16]:165409, 2011.

92      H. Meltzman, D. Chatain, D. Avizemer, T. M. Besmann and W. D. Kaplan, The Equilibrium Crystal Shape of Nickel, Acta Materialia, 59[9]:3473-3483, 2011.

91      M. Baram, D. Chatain and W.D. Kaplan, Nanometer-Thick Equilibrium Films: The Interface Between Thermodynamics and Atomistics, Science, 332, 206-209, April 8, 2011.

90      V. Mikhelashvili, B. Meyler, M. Garbrecht, S. Yofis, J. Salzman, T. Cohen-Hyams, W. D. Kaplan, Y. Roizin, M. Lisiansky and G. Eisenstein, Optical Properties of Nonvolatile Memory Capacitors Based on Gold Nanoparticles and SiO2-HfO2 Sublayers, Applied Physics Letters, 98[2]: 022905-1-3, 2011.

89      V. Mikhelashvili, G. Eisenstein, Y. Roizin, B. Meyler, M. Garbrecht, T. Cohen-Hyams, W.D. Kaplan, Y. Salzman, M. Lisiansky, The Effect of Light Irradiation on Electrons and Holes Trapping in sub 10nm SiO2-HfO2 Insulator Stacks with Au Nanocrystals, Microelectronics Engineering, 88:964-968, 2011.

88      Y. Liebes, M. Drozdov, Y. Y. Avital, Y. Kauffmann, H. Rapaport, W. D. Kaplan and N. Ashkenasy, Reconstructing Solid State Nanopore Shape from Electrical Measurements, Applied Physics Letters, 97[22]:223105-223103, 2010.

87      M. Drozdov, Y. Kauffmann, W.C. Carter and W.D. Kaplan, Shape-Controlled Nanopores in Single Crystals, Nanotechnology 21:475301-6, 2010.

86      S.H. Oh, M.F. Chisholm, Y. Kauffmann, W.D. Kaplan, W. Luo, M. Rühle, C. Scheu, Oscillatory Mass Transport in Vapor-Liquid-Solid Growth of Sapphire Nanowires, Science, 380:489-493, 2010.

85      V. Mikhelashvili, P. Thangadurai, W. D. Kaplan and G. Eisenstein, The Correlation of the Electrical Properties with Electron Irradiation and Constant Voltage Stress for MIS Devices Based on High-k Double Layer (HfTiSiO:N and HfTiO:N) Dielectrics, Microelectronic Engineering, 87: 1728–1734, 2010.

84      P. Thangadurai, V. Mikhelashvili, G. Eisenstein, and W.D. Kaplan, Microstructure and Chemical Analysis of Hf-Based High-k Dielectric Layers in Metal-Insulator-Metal Capacitors, Thin Solid Films, 518[15]: 4467-4472, 2010.

83      W. Craig Carter, Mor Baram, Maria Drozdov, and Wayne D. Kaplan, Four Questions About Triple Junctions, Scripta Materialia, 62[12]:894-898, 2010.

82      V. Mikhelashvili, B. Meyler, S. Yoffis, J. Salzman, M. Garbrecht, T. Cohen-Hyams, W.D. Kaplan, and G. Eisenstein, A Nonvolatile Memory Capacitor Based on a Double Gold Nano-Crystal Storing Layer and High-k Dielectric Tunneling and Control Layers, Journal of the Electrochemical Society, February, 157[4]: 463-469, 2010.    DOI: 10.1149/1.3302003

81      H. Meltzman, Y. Kauffmann, P. Thangadurai, M. Drozdov, M. Baram, D. Brandon and W.D. Kaplan, An Experimental Method for Calibration of the Plasmon Mean-Free-Path, Journal of Microscopy, 236[3]:165-173, 2009.

80      V. Mikhelashvili, B. Meyler, S. Yoffis, J. Salzman, M. Garbrecht, T. Cohen-Hyams, W.D. Kaplan, and G. Eisenstein, A Nonvolatile Memory Capacitor Based on Au Nanocrystals with HfO2 Tunneling and Blocking Layers, Applied Physics Letters, 95[2]:023104-3, 2009.

79      P. Thangadurai, W.D. Kaplan, V. Mikhelashvili, G. Eisenstein, The Influence of Electron-Beam Irradiation on Electrical Characteristics of Metal-Insulator-Semiconductor Capacitors Based on a High-k Dielectric Stack of HfTiSiO(N) and HfTiO(N) Layers, Microelectronics Reliability, 49:716-720, 2009.

78      M. Baram and W.D. Kaplan, Quantitative HRTEM Analysis of FIB Prepared Specimens, Journal of Microscopy, 232[3]: 395-405, 2008.  (Figure from article selected for journal cover).

77      E. Shaffir, I. Riess, and W.D. Kaplan, The Mechanism of Initial De-wetting and Detachment of Thin Au Films on YSZ, Acta Materialia, 57[1]: 248-256, 2008.

76      L. Miller and W.D. Kaplan, Water-Based Method for Processing Aluminum Oxynitride (AlON), International Journal of Applied Ceramic Technology, 5[6]: 641-648, 2008.

75      M. Drozdov, G. Gur, Z. Atzmon and W. D. Kaplan, Detailed investigation of ultrasonic Al–Cu wire-bonds: II. Microstructural evolution during annealing, Journal of Materials Science, 43[18]:6038-6048, 2008.

74      M. Drozdov, G. Gur, Z. Atzmon and W. D. Kaplan, Detailed investigation of ultrasonic Al–Cu wire-bonds: I. Intermetallic formation in the as-bonded state, Journal of Materials Science, 43[18]:6029-6037, 2008.

73      P. Thangaduraia, Y. Lumelsky, M.S. Silverstein and W.D. Kaplan, TEM specimen preparation of semiconductor-PMMA-metal interfaces, Materials Characterization, 59[11]:1623-1629, 2008.

72      V. Mikhelashvili, T. Paramasivam, W.D. Kaplan, R. Brener, C. Saguy, and G. Eisenstein, The Use of Nanolaminates to Obtain Structurally Stable High-K Films with Superior Electrical Properties: HfNO-HfTiO, Journal of Applied Physics, 103[11]:114106-114109, 2008.

71      L. Miller and W.D. Kaplan, Solubility Limits of La and Y in Aluminum Oxynitride (AlON) at 1870°C, Journal of the American Ceramic Society, 91[5]: 1693–1696, 2008.

70      V. Mikhelashvili, P. Thangadurai, W. D. Kaplan and G. Eisenstein, High capacitance density metal-insulator-metal structures based on a high-k HfNxOy–SiO2–HfTiOy laminate stack, Applied Physics Letters, 92[13]:132902–3, 2008.

69      A. Karpel, G. Gur, Z. Atzmon, and W.D. Kaplan, Microstructural Evolution of Gold-Aluminium Wire-Bonds, Journal of Materials Science, 42[7]: 2347-2357 , 2007.

68      A. Karpel, G. Gur, Z. Atzmon, and W.D. Kaplan, TEM Microstructural Analysis of As-Bonded Al-Au Wire-Bonds, Journal of Materials Science, 42[7]: 2334-2346, 2007.

67      W.D. Kaplan and Y. Kauffmann, Structural Order in Liquids Induced by Interfaces with Crystals, Annual Review of Materials Research, 36[1]: 1-48, 2006. (Review)

66      M. Baram and W.D. Kaplan, Intergranular Films at Au-Sapphire Interfaces, Journal of Materials Science, 44[23]:7775-7784, 2006.

65      H. Sadan and W.D. Kaplan, Morphology and Orientation of the Equilibrated Au-Sapphire (10-10) Interface, Journal of Materials Science, 41[16]: 5371-5375, 2006.

64      H. Sadan and W.D. Kaplan, Au-Sapphire (0001) Solid-Solid Interfacial Energy, Journal of Materials Science, 41[16]: 5099-5107, 2006.

63      S. Avraham, P. Bayer, R. Janssen, N. Claussen, and W.D. Kaplan, Characterization of a-Al2O3 – (Al-Si)3Ti Composites, Journal of the European Ceramic Society, 26[13]: 2719-2726, 2006.

62      G. Levi and W.D. Kaplan, The Influence of Interfacial Wetting and Adhesion on the Formation of Voids at Metal-Ceramic Interfaces, Journal of Materials Science, 41[3]: 817-821, 2006.

61      L. Miller, A. Avishai, and W.D. Kaplan, Solubility Limit of MgO in Al2O3 at 1600°C, Journal of the American Ceramic Society, 89[1]: 350-353, 2006.

60      S.H. Oh, Y. Kauffmann, C. Scheu, W.D. Kaplan, and M. Ruhle, Ordered Liquid Aluminum at the Interface with Sapphire, Science, 310[5748]: 661-663, 2005.

59      S. Avraham and W.D. Kaplan, Reactive Wetting of Rutile by Liquid Aluminium, J. Materials Science, 40[5]:1093-1100, 2005.

58      Y. Kauffmann, A. Rečnik, and W.D. Kaplan, The Accuracy of Quantitative Image Matching For HRTEM Applications, Materials Characterization, 54:194-205, 2005.

57         A. Avishai and W.D. Kaplan, Intergranular Films at Metal-Ceramic Interfaces: Part II – Calculation of Hamaker Coefficients, Acta Materialia, 53[5]:1571-1581, 2005.

56      A. Avishai, C. Scheu, and W.D. Kaplan, Intergranular Films at Metal-Ceramic Interfaces: Part I – Interface Structure & Chemistry, Acta Materialia, 53[5]:1559-1569, 2005.

55      R. Edrei, R. Shima, V.V. Gridin, Y. Roizin, W.D. Kaplan, and A. Hoffman, Evolution of Surface-Topography of as-Grown Si Films Near the Amorphous-to-Polycrystalline Transition, Journal of The Electrochemical Society, 151[12]:904-909, 2004.

54      T. Cohen-Hyams, J.M. Plitzko, C.J.D. Hetherington, J.L. Hutchison, J. Yahalom, and W.D. Kaplan, Microstructural Dependence of Giant-Magnetoresistance in Electrodeposited Cu-Co Alloys, Journal of Materials Science, 39:5701-5709, 2004.

53      I. Fisher, W.D. Kaplan, and M. Eizenberg, Dielectric Property-Microstructure Relationship for Nanoporous Silica Based Thin Films, Journal of Applied Physics, 95[10]:5762-5767, 2004.

52      A. Avishai and W.D. Kaplan, Intergranular Films in Metal-Ceramic Composites and the Promotion of Metal Particle Occlusion, Zeitschrift für Metallkunde, 95:266-270, 2004.

51      W.D. Kaplan, D. Rittel, M. Lieberthal, N. Frage, and M.P. Dariel, Static and Dynamic Mechanical Damage Mechanisms in TiC-1080 Steel Cermets, Scripta Materialia, 51[1]:37-41, 2004.

50      O. Aharon, S. Bar-Ziv, D. Gorni, T. Cohen-Hyams, and W.D. Kaplan, Residual Stresses and Magnetic Properties of Alumina-Nickel Nanocomposites, Scripta Materialia, 50[9]:1209-1213, 2004.

49      G. Levi, D.R. Clarke and W.D. Kaplan, Free Surface and Interface Thermodynamics of Liquid Nickel in Contact with Alumina, Interface Science, 12[1]:73-83, 2004.

48      A. Avishai, C. Scheu, and W.D. Kaplan, Amorphous Films at Metal-Ceramic Interfaces, Zeitschrift für Metallkunde, 94:272-276, 2003.

47      G. Levi and W.D. Kaplan, Aluminium-Alumina Interface Morphology and Thermodynamics from Dewetting Experiments, Acta Mater., 51:2793-2802, 2003.

46      T. Cohen-Hyams, W.D. Kaplan, D. Aurbach, Y.S. Cohen, and J. Yahalom, Electrodeposition of Granular Cu-Co Alloys, Journal of the Electrochemical Society, 150[1]:C28-C35, 2003.

45      A. Hashibon, J. Adler, M. Finnis, and W.D. Kaplan, Atomistic Study of Structural Correlations at a Liquid-Solid Interface, Computational Materials Science, 24:443-452, 2002.

44      T. Cohen-Hyams, W.D. Kaplan, and J. Yahalom, Structure of Electrodeposited Cobalt, Electrochemical and Solid-State Letters 5 [8]: C75-C78, 2002.

43      G. Levi and W.D. Kaplan, Iron as an Oxygen Tracer at the Aluminium-Alumina Interface, J. Am. Ceram. Soc, 85[6]:1601-1606, 2002.

42      A. Goldstein, W.D. Kaplan, and A. Singurindi, Liquid Assisted Sintering of SiC Powders by MW (2.45GHz) Heating, J. European Ceramic Soc., 22[11]:1891-1896, 2002.

41      G. Levi, W.D. Kaplan, and M. Bamberger, Interfacial Phenomena and Microstructure Evolution During Solidification of Binary and Ternary Al-Mg-Si Alloys Cast with Titanium Carbonitride,  Mat. Sci. & Eng. A, 326:288-296, 2002.

40      G. Levi and W.D. Kaplan, Oxygen Induced Interfacial Phenomena During Wetting of Alumina by Liquid Aluminium, Acta Materialia 50: 75–88, 2002.

39      G. Levi, C. Scheu, and W.D. Kaplan, Segregation of Aluminium at Nickel-Sapphire Interfaces, Interface Science, 9:213-220, 2001.

38      A. Hashibon, J. Adler, M.W. Finnis, and W.D. Kaplan, Ordering at Solid-Liquid Interfaces Between Dissimilar Materials, Interface Science, 9:175-181, 2001.

37      C. Scheu, G. Dehm, and  W. D. Kaplan, Equilibrium Amorphous Si-Ca-O-Films at Interfaces in Copper-Alumina Composites Prepared by Melt-Infiltration, J. Am. Ceram. Soc., 84[3]:623-630, 2001.

36      M. Lieberthal and W.D. Kaplan, Processing and Properties of Al2O3 Nanocomposites Reinforced with Sub-Micron Ni and NiAl2O4, Mat. Sci. & Eng. A, 302[1]:83-91, 2001.

35      L. Shepeleva, B. Medres, W.D. Kaplan, M. Bamberger, M.H. McCay, T.D. McCay, and M. Sharp, Laser Induced Cu-Alumina Bonding:  Microstructure and Bond Mechanism, Surface & Coatings Technology, 125:40-44, 2000.

34      L. Shepeleva, B. Medres, W.D. Kaplan, M. Bamberger, and A. Weisheit, Laser Cladding of Turbine Blades, Surface & Coatings Technology, 125:45-48, 2000.

33      C. Scheu, G. Dehm, W.D. Kaplan, D.E. Garcia, and N. Claussen, Microstructure of Alumina Composites Containing Niobium and Niobium Aluminides, J. Am. Ceram. Soc., 83[2]:397-402, 2000.

32      B. Medres, L. Shepeleva, W.D. Kaplan, and M. Bamberger, The Effectiveness of Laser Plasma Material Processes, Lasers in Engineering,  9: 205-214, 1999.

31      T. Cohen, J. Yahalom, and W.D. Kaplan, Electrodeposition of Metallic Multilayers by a Pulse Method, Rev. Anal. Chem., 18[5]:279-284, 1999.

30      G. Levi, M. Bamberger, and W.D. Kaplan, Wetting of Porous Titanium Carbonitride by Al-Mg-Si Alloys, Acta Mater., 47[14]:3927-3934, 1999.

29      M. Avinun, W.D. Kaplan, M. Eizenberg, T. Guo, and R. Mosely, Factors Which Determine the Orientation of CVD Al Films Grown on TiN, Solid State Electronics, 43:1011-1014, 1999.

28      L. Shepeleva, B. Medres, W.D. Kaplan, M. Bamberger, C.M. Sharp, M.H. McCay, and T.D. McCay, Morphology of Laser Treated Polycrystalline a-Al2O3, Journal of Laser Applications, 11[1]:38-41, 1999.

27      M. Avinun, N. Barel, W.D. Kaplan, M. Eizenberg, M. Naik, T. Guo, L.Y. Chen, R. Mosely, K. Littau, S. Zhou, and L. Chen, Nucleation and Growth of CVD Al on Different Types of TiN, Thin Solid Films, 320[1]:67-72,1998.

26      W.D. Kaplan, Influence of Ca on Interface Structure and Chemistry in Melt-Infiltrated a-Al2O3/Al Composites, Acta Mater., 46[7]:2369-2379, 1998.

25      X. Pan, W.D. Kaplan, M. Rühle, and R.E. Newnham, Quantitative Comparison of Transmission Electron Microscopy Techniques for the Study of Localized Ordering on a Nano-Scale, J. Am. Ceram. Soc., 81[3]:597-605, 1998.

24      G. Levi, W.D. Kaplan, and M. Bamberger, Structure Refinement of TiCN,  Materials Letters, 35:344-350, 1998.

23      M. Bamberger, U. Nemaizer, G. Levi, and W.D. Kaplan, Microstructure Refinement of Cast Intermetallic Alloys: A New Application for Nano-Crystalline Powders, Mat. Sci. Forum, 269-272:1061-1066, 1998.

22      C. Scheu, G. Dehm, W.D. Kaplan, F. Wagner, and N. Claussen, Microstructure and Phase Evolution of Niobium-Aluminide-Alumina Composites Prepared by Melt-Infiltration, Phys. Stat. Sol. a, 166:241-255, 1998.

21      M. Bamberger, W.D. Kaplan, B. Medres, and L. Shepeleva, Calculation of Process Parameters For Laser Alloying and Cladding, Journal of Laser Applications, 10[1]:29-33, 1998.

20      W.D. Kaplan, M. Avinun, M. Eizenberg, M. Naik, T. Guo, and R. Mosely, Electron Microscopy of CVD Al: Nucleation and Growth, Journal of Computer Assisted Microscopy, 9[1]:5-8, 1997.

19      D. Parnis, E. Zolotoyabko, W.D. Kaplan, M. Eizenberg, N. Mosleh, F. Meyer and C. Schwebel, Structural Disorder in SiGe Films Epitaxially Grown on Si by Ion Beam Sputter Deposition, Thin Solid Films, 294:64-68, 1997.

18      M. Lyakas, D. Parnis, W.D. Kaplan, E. Zolotoyabko, M. Eizenberg, V. Demuth, and H.P. Strunk, Unusual Strain Relaxation in SiGe/Si Heterostructures, Appl. Phys. Lett., 70:1287-1289, 1997.

17      W.D. Kaplan, I. Levin, and D.G. Brandon, Significance of Faceting On SiC Nanoparticles in Alumina, Materials Science Forum, 207-209:733-736, 1996.

16      H. Müllejans, W.D. Kaplan, and M. Rühle, Interfaces Between Al and a-Al2O3 in Melt-Infiltrated Alumina, Materials Science Forum, 207-209:405-408, 1996.

15      I. Levin, D.G. Brandon, W.D. Kaplan, H. Müllejans, and M. Rühle, Phase Boundaries Among the Metastable Precursor Phases to a-Al2O3, Materials Science Forum, 207-209:749-752, 1996.

14      W.D. Kaplan and G. Kimmel, Ordered LaGa4 and Its Relation To Other Structures in The Ga-La Binary System, J. Alloys & Compounds, 232:126-132, 1996.

13      W.D. Kaplan, H. Müllejans, M. Rühle, J. Rödel, and N. Claussen, Ca Segregation To Basal Surfaces in a-Alumina, J. Am. Ceram. Soc., 78[10]:2841-2844, 1995.

12      I. Goldfarb, W.D. Kaplan, S. Ariely, and M. Bamberger, Fault-Induced Polytypism in (Cr,Fe)2B, Phil. Mag. A, 72:963-979, 1995.

11      I. Levin, W.D. Kaplan, D.G. Brandon, and A.A. Layyous, Effect of SiC Submicron Particle Size and Content on Fracture Toughness of Alumina-SiC Nanocomposites, J. Am. Ceram. Soc., 78:254-256, 1995.

10      W.D. Kaplan, P.R. Kenway, and D.G. Brandon, Polymorphic Basal Twin Boundaries and Anisotropic Growth in a-Al2O3, Acta Met., 43.835-848, 1995.

9        I. Levin, W.D. Kaplan, T. Wieder, and D.G. Brandon, Residual Stresses in Alumina-SiC Nano-Composites, Acta Met., 42:1147-1154, 1994.

8        W.D. Kaplan and D.G. Brandon, Self Supporting Ceramic Films For Grain Boundary Characterization, Mat. Sci. Forum, 126-128:173-176, 1993.

7        G. Kimmel and W.D. Kaplan, A New Phase Transition Phenomenon In Gallium-Lanthanide Binary Alloys, Scripta Metallurgica, 25:571-574, 1991.

6        W.D. Kaplan and G. Kimmel, Rietveld Analysis and Pair Wise Substitution Alloys, Advances in X-Ray Analysis, 35:63-68, 1991.

5        W.D. Kaplan, G. Kimmel, T. Wieder, K. Thoma, and H. Gartner, Ion Implantation of MoNi4 and La-Ga Alloys, GSI Scientific Report, 91-1:238, 1991.

4        G. Kimmel and W.D. Kaplan, Enhanced Range Of Measurable Thickness Of Thin Crystalline Layers Using q/2×q Decoupled Powder X-Ray Diffraction, Advances in X-Ray Analysis, 33:121-127, 1990.

3        G. Shafirstein, M. Bamberger, W.D. Kaplan and G. Kimmel, Residual Stress Analysis of Laser Treated Al203 Coatings, IITT Technology Transfer Series, Residual Stress, pgs. 347-351, 1990.

2        W.D. Kaplan and G. Kimmel, Order and Disorder Phases in Gallium Rich Gallium-Lanthanum Alloys, Acta Cryst. A., 46:C281-C282, 1990.

1        G.S. Mandel, K.M. Renne, A.M. Kolbach, W.D. Kaplan, J.D. Miller, and N.S. Mandel, Calcium Pyrophosphate Crystal Deposition Disease – Preparation and Characterization of Crystals, J. Crystal Growth, 87:453-462, 1988.