Posters

Computer Simulations (MD & EMS) for the Determination of Imaging Conditions in the Study of Solid-Liquid Interfaces by HRTEM

Y. Kauffmann & W.D. Kaplan

 

The Influence of Contrast Delocalization on TEM Image Interpretation

A. Altberg, Y. Kauffmann & W.D. Kaplan

 

Microstructure of Ni-SiC Nanocomposites

D. Benes Dahan, E. Gross & W.D. Kaplan

 

SiO2 Reduction During Sintering of SiC

E. Gross, D. Benes Dahan & W.D. Kaplan

 

Equilibrium Shape of Nanometric Holes

M. Drozdov, Y. Kauffmann, W.C. Carter & W.D. Kaplan

 

Influence of Processing on the Microstructure and Properties of Ni-Al2O3 Nanocomposites

G. Gluzer & W.D. Kaplan

 

Solid-State Dewetting and Pt-SrTiO3 Interfaces

G. Atiya, A. Altberg, V. Mikhehashvili, G. Eisenstein &W.D. Kaplan

 

Structure and Energy of the Equilibrated Ni-YSZ Solid-Solid Interface

H. (Bratt) Nahor, H. Meltzman & W.D. Kaplan

 

Atomistic Structure of the Equilibrated Ni(111)-YSZ(111) Solid-Solid Interface

H. (Bratt) Nahor & W.D. Kaplan

 

The Mechanism of Grain Growth in SrTiO3

H. Sternlicht, W. Rheinheimer, A. Mehlmann, A. Rothchild, M.J. Hoffmann & W.D. Kaplan

 

Anisotropic Grain Boundary Mobility in Undoped and Ca Doped a-Alumina

R. Akiva & W.D. Kaplan

 

In-situ TEM Observations of Silicon Carbide Formation and Characterization of the Silicon-Carbon Interface

R. Marder, P. Ghosh, H. Sternlicht & W.D. Kaplan

 

Quantitative Chemical Analysis in TEM

T. Mao, R. Moshe, H. Sternlicht, R. Marder & W.D. Kaplan

 

The Influence of Solutes on Grain Boundary Mobility in Alumina

R. Moshe & W.D. Kaplan

 

The Solubility Limit of SiO2 in a-Alumina at 1600°C

R. Moshe & W.D. Kaplan

 

Sub-Surface Object Characterization using Backscattered Electrons

I. Nassar & W.D. Kaplan

 

The Influence of Carbon on the Microstructure of Sintered Alumina

R. Marder, L. Rudnik & W.D. Kaplan